GloryBolt is a silicon-verified IR Drop and Electromigration (EM) analysis platform with signoff precision. It verifies reliability for full-chip power networks and signal lines, handling designs with hundreds of millions of cells, and provides analysis for power, current density, voltage drop, and EM. With an intuitive workflow and visual diagnostics, GloryBolt quickly delivers signoff-level results, pinpointing design defects to improve iteration efficiency. It meets industry golden standards for Static IR, Dynamic IR, PG EM, Signal EM, and Grid Check, certified by multiple foundries. Its elastic computing architecture scales resources to address large-scale IC design challenges.
High-Precision Simulation:
Dynamic IR Drop analysis uses GloryBolt Power Library (GPL) for more accurate cell current waveforms than traditional lib files, improving dynamic IR accuracy and reflecting real chip operation.
High-Performance Architecture:
Distributed Machine Processing (DMP) with Logic Partition technology ensures boundary condition correctness during matrix solving, optimizing performance while maintaining precision.
Multi-Node Certification:
Validated on 28nm, 14nm, and more advanced nodes at leading foundries. EM process files and GPL databases are adopted by design customers for tape-out projects.
System-Level Multi-Physics Analysis:
Supports package-die co-simulation with Spice netlists (e.g., RCLK) and PCB models, enabling Die-Package-PCB system-level EMIR analysis.
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